#Taiwan #Hsinchu #MPI Corporation #TITAN Probes #PNA-X

MPI Corporation Unveils Next-Generation 250 GHz Broad-Band Testing Solution

MPI Corporation, a global leader in advanced semiconductor testing solutions, is making waves in the industry with the introduction of its innovative 250 GHz broad-band testing system. This cutting-edge solution, designed for the new frequency extender NA5305A/7A PNA-X from Keysight Technologies, exemplifies MPI's extensive experience and prowess in the realm of sub-terahertz probing and wafer-level measurements.

A Perfectly Integrated System

The latest offering from MPI fully integrates its TITAN™ RF probes with a probe station platform, enabling unparalleled performance in broad-band S-parameter characterization approaching 250 GHz. This launch marks a significant milestone, showcasing MPI's commitment to pushing the boundaries of high-frequency testing solutions.

Stojan Kanev, the General Manager of the Advanced Semiconductor Testing Division at MPI Corporation, emphasized that MPI was the first to demonstrate real-time single-sweep calibration and wafer-level measurements at frequencies up to 250 GHz. This new solution combines the powerful TITAN™ probe technology with MPI's system expertise to deliver consistent, repeatable results, providing engineers with clear probe visibility and enhanced safety features during setup, thereby saving valuable time and optimizing performance.

Precision for Sub-THz Applications

The 250 GHz probe solution encompasses single-ended T250MAK probes and differential T250MSK probes that utilize a new 0.5 mm broad-band coaxial interface designed for high-speed differential testing and characterization of broad-band devices. Key features include:

• - Ultra-Low Insertion Loss: Ensuring maximized signal integrity across the entire frequency range.
• - Exceptional Return Loss: Guaranteeing minimal signal reflection, crucial for accurate measurements.
• - Unique Tip Visibility: Allowing for precise alignment and consistent data acquisition.
• - Retractable Tip Protector: Enhancing safe handling of the delicate probes.

The probes come in both single-ended (GSG) and differential (GSGSG) configurations, making them adaptable to various device types.

These probes blend seamlessly with the MPI probe station portfolio, facilitating wafer-level measurements under controlled temperature conditions with minimum user intervention for maximum system repeatability. This integration is vital as the semiconductor industry grapples with increasing performance demands driven by innovations in AI, 5G/6G, and high-speed optical communications.

Keysight’s Perspective on the Collaboration

David Tanaka, Product Manager at Keysight, praised MPI's innovation in high-frequency wafer testing as instrumental in enhancing the measurement capabilities of their broad-band vector network analyzer platform. He highlighted that the TITAN™ probes provide the necessary accuracy and repeatability to fully leverage the potential of their 250 GHz solution, addressing the escalating demands for advanced testing at sub-terahertz frequencies.

Meeting the Evolving Needs of Semiconductor Testing

As the industry moves toward unprecedented performance benchmarks, especially in the semiconductor sector driven by cutting-edge applications and technologies, the need for sophisticated testing and measurement tools has never been more pressing. The MPI 250 GHz broad-band solution meets this need by enabling:

• - Fully calibrated single-sweep broad-band S-parameter measurements up to 250 GHz.
• - Capable of handling both modulated and non-linear broad-band measurements.
• - Comprehensive integration with industry-leading testing instrumentation for a complete measurement chain.

This state-of-the-art solution is currently being deployed in evaluation settings across key customer and partner facilities, with demonstration systems available in MPI's locations in Taiwan and the United States. A public unveiling is scheduled for the European Microwave Week (EuMW) 2025 in Utrecht, Netherlands, where an interactive live setup will showcase its capabilities.

About MPI Corporation

Founded in 1995 and headquartered in Hsinchu, Taiwan, MPI Corporation is a leading provider of semiconductor testing solutions specializing in advanced device characterization. Its Advanced Semiconductor Testing Division focuses on RF/microwave probing, high-power device characterization, silicon photonics, and wafer-level reliability. With innovations such as the TITAN™ RF probe series, WaferWallet® automation, and the TS/IFE platform family, MPI is synonymous with precision, reliability, and performance throughout the semiconductor testing ecosystem.

For more information, visit www.mpi-corporation.com.