Central Optical Publishing Hosts Workshop for Patent Search Competition Using PatSnap Analytics

Central Optical Publishing to Host Workshop on Patent Search Using PatSnap Analytics

Central Optical Publishing, located in Koto City, Tokyo, is set to conduct a specialized workshop aimed at participants interested in the upcoming patent search competition. Scheduled for June 5, 2026, this event will take place at the Hibiya Library and Museum, with support from PatSnap Inc., the provider of PatSnap Analytics.

Given that Central Optical Publishing operates as the authorized dealer for PatSnap products in Japan, this workshop aims to offer extensive tools and support for patent search and investigation. The workshop is limited to just 20 participants, with a primary focus on methodologies and the thought processes behind designing search criteria essential for the competition.

All participants will receive a free trial ID for PatSnap Analytics, allowing them to familiarize themselves with the software while gaining hands-on experience in navigating the system.

Workshop Focus: Learning Search Techniques

This workshop will delve into effective search methods tailored to the patent search competition scenario. The participants will receive a trial ID, enabling them to utilize PatSnap Analytics free of charge for a certain period. The limited size of the group and the in-person format encourage interactive learning, where experts will guide attendees on how to interpret search requirements and convert them into workable search formulas. The session will also include analyses of search results, teaching how to adjust search criteria for optimal outcomes in the context of the competition.

What is the Patent Search Competition?

The patent search competition is an event where participants are tasked with accurately gathering relevant patent information based on set challenges. Competitors must demonstrate various skills, including comprehending the nuances of the provided tasks, translating technical content into appropriate keywords or classifications, and formulating valid search criteria. Mastery of search methodologies plays a critical role in determining success in this competition.

Overview of PatSnap Analytics

PatSnap Analytics is a powerful global patent search and utilization tool developed by PatSnap. It provides access to comprehensive patent data from across the globe, facilitating searches in Japanese. The software offers a variety of search methods such as simple, advanced, classification-based, and semantic searches, catering to diverse search needs. This workshop will feature an introduction to basic functionalities of PatSnap Analytics, preparing attendees for effective utilization.

Workshop Details

- Date: June 5, 2026
- Venue: Hibiya Library and Museum, Chiyoda City, Tokyo
- Format: In-person (Real event)
- Capacity: 20 participants (first-come, first-served)
- Participation Fee: Free
- Organizer: Central Optical Publishing
- Support: PatSnap
- Participant Benefit: Free trial ID for PatSnap Analytics

Please note that registration will close once capacity is reached.

Registration and Further Details

For more information about the workshop and to register, please check the following registration form link: Patent Search Competition Registration Form

About Central Optical Publishing

- Business Overview: Services related to patent and technological information
- Notes: Authorized dealer for PatSnap products in Japan
- Website: https://www.cks.co.jp/