#Japan #Tokyo #Canon #Sigray #JIMA 2026

Canon Marketing Japan at JIMA 2026

Canon Marketing Japan Inc., under the leadership of President Masachika Adachi, is set to participate in the 13th Comprehensive Testing Equipment Exhibition, JIMA 2026, which will take place from September 16 to 18, 2026, at Tokyo Big Sight, East Halls 1-3. The event is focused on non-destructive inspection, appearance inspection, and quality control systems, showcasing the latest advancements in testing equipment.

As the demand for efficiency and digitization in testing and measurement increases, Canon will introduce its state-of-the-art X-ray analysis systems that support rapid and sophisticated R&D initiatives. The Canon booth will feature products from Sigray, Inc., a company based in Benicia, California, which Canon has an exclusive distribution agreement with in Japan. This exhibition will present newly added products to the lineup, latest measurement cases, and insights into trends in analysis technology.

Product Highlights

One of the key highlights of the Canon display will be the Hybrid Nano 3D X-ray Microscope, ApexHybrid-210TM. This groundbreaking microscope, equipped with two different incident modes, specializes in observing large flat semiconductor substrates and automotive battery components in a slanted incident mode. The orthogonal incident mode achieves an industry-leading spatial resolution of under 0.40μm, facilitating high-precision and high-speed measurements for semiconductor substrates and battery materials.

Another impressive exhibit is the Nano X-ray Microscope, EclipseXRM-910TM, featuring a nano-focused X-ray source and a high-sensitivity detector. This microscope supports applications in detailed structural analysis and material evaluation, achieving non-destructive internal structure visualization with a spatial resolution of 300nm.

Additionally, Canon will showcase the Fluorescence X-ray Analysis Device, AttoMapTM, which uses patented high-brightness X-ray sources to visualize trace element distributions sensitively. This device enables synchrotron-like elemental mapping analysis across semiconductor, materials science, and life sciences fields. Another product, the X-ray Absorption Spectrometer, QuantumLeap, incorporates a patented high-brightness multi-target X-ray source, offering approximately 100μm spatial resolution and sub-eV energy resolution to precisely and efficiently analyze the chemical states of materials.

All showcased products will be presented using panels to introduce features and capabilities.

Seminar Information

In addition to the product showcase, Canon's Industrial Equipment Business Division will hold a seminar titled "Cutting-edge X-ray Analysis Solutions for Semiconductors and Batteries". This seminar will occur on September 16, 2026, from 13:30 to 14:15 at Seminar Area J1 in East Hall 1 of Tokyo Big Sight. Attendees can learn about novel X-ray CT devices that visualize fine defects in semiconductors and the internal structures of batteries non-destructively, along with advanced hybrid CT systems that aid in faulty analysis and quality improvement for large semiconductor substrates and laminated battery cells.

JIMA 2026 Exhibition Overview

• - Event Date: September 16 (Wed) – 18 (Fri), 2026
• - Opening Hours: 10:00 – 17:00
• - Venue: Tokyo Big Sight, East Halls 1-3
• - Organizer: Japan Society for Testing Instruments
• - Canon Booth Position: J-52
• - Admission Fee: Free (Pre-registration required)

Visit JIMA 2026 Official Website

For inquiries from the general public, please contact Canon's Industrial Equipment Business Division, Sales Department 1, Sales Section 3 at 03-3740-3399 (direct line).