#South Korea #Park Systems #Atomic Force Microscope #NX1 #Gwachon

Park Systems Launches NX1 Atomic Force Microscope

Park Systems Corp. has recently introduced the NX1, a compact and high-performance atomic force microscope (AFM) aimed at providing atomic resolution imaging under standard ambient conditions. Developed in partnership with renowned AFM expert Professor Franz J. Giessibl from the University of Regensburg, this revolutionary instrument makes atomic-scale imaging accessible to research laboratories globally, something that was previously only feasible in ultra-high vacuum environments.

The Technology Behind NX1

The NX1 builds upon the prototype Orpheus II, which demonstrated atomic resolution imaging in ambient conditions. Park Systems utilized the foundational architecture of Orpheus II, integrating it with their precision manufacturing capabilities and extensive experience in AFM engineering. The result is a microscope that boasts noise levels approximately one order of magnitude lower than conventional AFM systems, thus enabling atomic-scale imaging in everyday laboratory settings.

Dr. Sang Joon Cho, Executive Vice President at Park Systems, emphasized the significance of this collaborative effort: "The NX1 encapsulates the fusion of groundbreaking research from Professor Giessibl with our marketplace expertise. Together, we've created a reliable, technician-supported instrument that empowers researchers worldwide, a platform capable of shaping new markets."

Key Features of the NX1

The NX1 is engineered to deliver exceptional performance while simplifying daily use. It supports standard silicon cantilevers and offers an optional qPlus sensor for picometer-scale oscillation amplitudes and enhanced sensitivity to short-range forces. The redesigned cantilever swapping mechanism features a pre-aligned kinematic chip holder, ensuring straightforward operation. Additionally, the integrated optical microscope provides users with direct oversight of the probe and sample throughout the operation.

Professor Giessibl noted the transformation of the initial Orpheus II concept into a commercially viable product. He stated, "While Orpheus II demonstrated the concept's feasibility, it was more suited for expert researchers. Park Systems’ expertise was pivotal in evolving it into a reliable product for the broader research community. The NX1 embodies what this vision always had the potential to become."

Availability and Further Information

The NX1 is now available for orders, and for those interested in its technical specifications and application data, you can find more information on the official Park Systems website here.

About Park Systems

As a global leader in nanometrology, Park Systems provides advanced measurement solutions for both research and industrial applications. With regional offices across the Americas, Europe, and Asia, the company supports clients operating in semiconductor manufacturing, material science, and nanotechnology research. Their technology portfolio includes an array of products such as atomic force microscopy (AFM), spectroscopic ellipsometry, digital holographic microscopy, white light interferometry, and active vibration isolation systems. Founded by Dr. Sang-il Park, who was instrumental in the development of AFM technology at Stanford University, Park Systems continues to thrive through innovation and strategic acquisitions.

For additional details about Park Systems and its groundbreaking products, visit www.parksystems.com.