#South Korea #Park Systems #Atomic Force Microscopy #Gwacheon #NX1 AFM

Park Systems Introduces NX1: The Future of Atomic-Scale Imaging

Park Systems Corp., a leader in atomic force microscopy (AFM) solutions, has officially launched the NX1, a groundbreaking atomic force microscope designed for high-resolution imaging in everyday laboratory conditions. Developed in collaboration with Professor Franz J. Giessibl from the University of Regensburg, the NX1 brings a level of imaging quality previously only achievable in ultra-high vacuum environments to laboratories across the globe.

A New Era for AFM Technology

The NX1 is a compact, high-performance instrument that combines advanced technology with user-friendly design. This new model is based on the Orpheus II prototype, which demonstrated the feasibility of atomic resolution imaging outside of vacuum conditions. The partnership with Prof. Giessibl has been instrumental in converting academic research into a viable product that meets the demands of the wider research community.

Dr. Sang-Joon Cho, Executive Vice President at Park Systems, emphasized the collaboration's significance: "The NX1 reflects the culmination of Prof. Giessibl's research and our commitment to making cutting-edge scientific tools accessible. This product will open new avenues in various fields of nanotechnology."

Technical Features and Usability

The NX1 is engineered to achieve an impressive noise floor that is approximately an order of magnitude lower than that of conventional AFM systems, allowing it to deliver exquisite atomic-scale imaging even in routine lab environments. The microscope is compatible with standard silicon cantilevers and offers an optional qPlus sensor that permits picometer-level precision in oscillation amplitudes.

User engagement is enhanced with a pre-aligned kinematic chip carrier system, enabling straightforward probe exchanges, while an integrated optical microscope provides real-time visualization of the probe and sample during operation. Additionally, the NX1 is fully compatible with Park Systems' SmartScan™ software and SmartAnalysis™ platform, ensuring comprehensive usability and analytical capabilities.

Prof. Giessibl remarked, "While Orpheus II proved the concept, it was confined to research settings. Park Systems has transformed it into a dependable, user-friendly microscope that can benefit a broader spectrum of researchers. The NX1 fulfills the initial vision of the project."

Availability and Applications

The NX1 is now available for orders, catering to various applications in semiconductor manufacturing, materials science, and nanotechnology research. Its introduction not only signifies a technological leap but also an opportunity for many research labs to incorporate atomic-scale imaging into their work, fostering innovation in scientific research.

For detailed technical specifications and further application data, visit the official Park Systems product page.

About Park Systems

Park Systems is recognized globally as a pioneering force in nanometrology, offering state-of-the-art measurement solutions for both research and industrial applications. The organization's extensive technology portfolio includes AFM, digital holographic microscopy, and active vibration isolation systems. Founded by Dr. Sang-il Park, a key figure in the invention of AFM at Stanford University, Park Systems continues to thrive through innovation and strategic acquisitions that enhance its leadership in the nanometrology sector. For more information, visit Park Systems.