#South Korea #Park Systems #AFM #Gwacheon #NX1

Park Systems Unveils NX1: The Advanced Atomic Force Microscope

Park Systems Corp. has officially announced the launch of the NX1, a state-of-the-art atomic force microscope (AFM) that pushes the boundaries of imaging technology. Designed for practical use, this compact and powerful microscope offers atomic resolution imaging under ambient conditions, marking a significant advancement in nanotechnology.

Collaboration with Experts

The NX1 was developed in collaboration with Professor Franz J. Giessibl from the University of Regensburg, a leading authority in atomic-resolution AFM microscopy. This partnership has facilitated the translation of academic research into a reliable commercial product, making once-unreachable imaging capabilities accessible to research laboratories worldwide.

Technological Innovations

As a successor to the Orpheus II prototype, the NX1 implements groundbreaking technology that was previously limited to ultra-high vacuum environments. The powerful design combines the proven core architecture of Orpheus II with Park Systems' expertise in precision manufacturing, ensuring exceptional thermal stability. As a result, the NX1 achieves noise levels that are an order of magnitude lower than those of conventional AFM systems, enabling routine use of atomic-scale imaging.

Dr. Sang-Joon Cho, Executive Vice President of Park Systems, expresses pride in the partnership with Professor Giessibl. He highlights the unique collaborative effort that has resulted in the NX1: "The NX1 exemplifies what can be achieved when groundbreaking research meets the ability to bring advanced science to market effectively. Together, we've developed a tool that reshapes and creates new markets for researchers everywhere."

User-Friendly Features

Designed for both performance and usability, the NX1 supports standard silicon cantilevers and includes an optional qPlus sensor, facilitating precise measurements with exceptional sensitivity. The user-friendly kinematic chip holder system simplifies probe exchanges, while an integrated optical microscope offers researchers a direct view of the probe and sample throughout the operation.

The NX1 seamlessly integrates with Park Systems' proprietary SmartScan™ operating software and SmartAnalysis™ image analysis platform, enhancing user experience and functionality. Professor Giessibl remarks, "While Orpheus II proved the concept, it was limited to expert users only. Thanks to Park Systems' expertise, we have created a reliable product for the broader research community to leverage."

Availability and Specifications

The NX1 is now available for order, with detailed technical specifications and application data accessible on Park Systems' official website. This launch signals a new era for atomic imaging, making sophisticated AFM technology attainable for laboratory settings.

About Park Systems

Park Systems is a globally recognized leader in nanometrology, committed to offering advanced measurement solutions for both research and industry applications. With regional offices across North and South America, Europe, and Asia, the company serves customers in semiconductor manufacturing, material sciences, and nanotechnology research.

Founded by Dr. Sang-il Park, a key innovator behind AFM technology at Stanford University, Park Systems continues to excel through ongoing innovation and strategic acquisitions, including Accurion GmbH and Lyncée Tec SA. To learn more, visit Park Systems.