#South Korea #Semiconductor #Park Systems #Gwacheon #Metrology Solutions

Park Systems Introduces Advanced Metrology Solutions for 3D Packaging and Logic Research

In a significant move for the semiconductor industry, Park Systems, renowned for its atomic force microscopy and nanoscale metrology solutions, has announced the inception of a new joint development program (JDP). This venture aims to explore, assess, and enhance measurement solutions that cater to the demands of next-generation 3D packaging and logic technologies, combining a variety of advanced methodologies including atomic force microscopy (AFM), white light interferometry (WLI), imaging spectroscopic ellipsometry (ISE), and digital holographic microscopy (DHM).

The collaboration harnesses the resources and expertise of imec, a notable research hub in Belgium focused on semiconductor technology innovation. With their state-of-the-art facilities, imec will supply samples rooted in cutting-edge 3D packaging frameworks that reflect the rising intricacies in semiconductor manufacturing.

Dr. Sang-il Park, Founder and CEO of Park Systems, articulated the significance of this partnership: "The semiconductor manufacturing landscape is increasingly complex, demanding enhanced metrology solutions. This JDP with imec utilizes our complete range of new metrology capabilities to tackle the challenges defining the future of semiconductor fabrication."

As the semiconductor industry progresses into this intricately layered landscape, every element of device integration becomes crucial. Philippe Leray, Vice President RD, Patterning at imec, highlighted the necessity of innovative and synergistic technologies to address the multifaceted challenges. He stated, "Future semiconductor architectures and materials present considerable new hurdles for device integration, especially in terms of metrology. Our collaboration with Park Systems will seek to illustrate how their cutting-edge technologies can facilitate the forthcoming semiconductor technology roadmap."

The joint development program will span two years and includes participation in imec's Industrial Affiliation Program (IIAP), focusing on 3D Systems Integration. This initiative signifies a pivotal step for Park Systems, coinciding with the grand opening of their new global headquarters in Gwacheon, South Korea. This facility is expected to enhance the collaborative capabilities that are essential for groundbreaking advancements in semiconductor research and application.

Park Systems stands as a leader in nanometrology, extending a broad array of measurement solutions to cater to both industrial and research needs. Dr. Sang-il Park's pivotal role in the invention of atomic force microscopy at Stanford University founded the groundwork for this pioneering company, which now remains at the forefront of innovation in the global nanometrology landscape. The portfolio strives to address the needs of sectors ranging from semiconductor manufacturing to materials science and nanotechnology research.

In summary, the launch of this joint development program represents an exciting advancement in the field of semiconductor technology. As Park Systems and imec embark on this collaborative journey, the semiconductor industry waits with bated breath for the advancement of technologies that are anticipated to reshape future manufacturing processes and standards. For further details about Park Systems and its innovative technologies, visit www.parksystems.com.