Park Systems Expands Capabilities with Acquisition of Rocky Mountain Nanotechnology
In a significant strategic move, Park Systems Corp, the global leader in atomic force microscopy (AFM) solutions, has announced the completion of its acquisition of Rocky Mountain Nanotechnology LLC (RMN). This acquisition marks an exciting chapter for Park Systems as it dives into the manufacturing of high-purity metal probes, particularly solid platinum and platinum-iridium AFM probes, further strengthening its product offerings and supply chain in the nanotechnology sector.
Founded in 2003 by Clayton Williams, a former physics professor at the University of Utah and an ex-research staff member at IBM, Rocky Mountain Nanotechnology has built a solid reputation over the last two decades. The company specializes in producing ultra-precise metallic AFM probes with tip radii capable of measuring just 10 nanometers. Their probes support a diverse range of AFM electrical modes and advanced applications, particularly in high-voltage contexts, including conductive AFM (C-AFM), electrostatic force microscopy (EFM), Kelvin probe force microscopy (KPFM), piezoelectric force microscopy (PFM), scanning capacitance microscopy (SCM), scanning microwave impedance microscopy (sMIM), and nano-IR spectroscopy. RMN's clients include prestigious universities and private research institutes globally, showcasing the high demand and credibility of their products.
Dr. Sang-il Park, founder and CEO of Park Systems, expressed enthusiasm for the acquisition, stating, "The metal solid probe technology from RMN seamlessly complements Park Systems' advanced electrical measurement modes and the next-generation nanoprobing systems currently under development. This acquisition represents a leap toward our strategy of ensuring a stable supply of high-performance specialized probes that underpin our electrical measurement solutions."
In the wake of this acquisition, Park Systems plans to set up a probe manufacturing facility in South Korea, leveraging technology transfer from RMN's existing operations in Salt Lake City, Utah. To ensure the seamless supply of their probes, RMN's US facility will continue operating at full capacity during the transition period, guaranteeing existing customers remain well supported.
Clayton Williams, the founder of Rocky Mountain Nanotechnology, shared insights into the new opportunities presented by this acquisition, stating, "Joining forces with Park Systems opens up new avenues for our probe technology, allowing us to pursue applications we could not have explored independently and fortifying our position in the global AFM probe market."
Current clients of RMN can continue to purchase their products as usual, with Park Systems committed to ensuring continuity while also introducing new probes and an expanded range within the combined organization.
About Park Systems
Park Systems is a global leader in nanometrology, providing advanced measurement solutions for research and industrial applications. With regional offices across the Americas, Europe, and Asia, the company supports clients in semiconductor manufacturing, material science, and nanotechnology research. Its technology portfolio encompasses atomic force microscopy (AFM), spectroscopic ellipsometry imaging, digital holographic microscopy, white light interferometry, and active vibration isolation systems. Founded by Dr. Sang-il Park, who contributed to the invention of AFM at Stanford University, the company has grown through continuous innovation and strategic acquisitions, including notable companies like Accurion GmbH and Lyncée Tec SA, to solidify its leadership in the global nanometrology industry.
For more information, visit
www.parksystems.com.
About Rocky Mountain Nanotechnology LLC
Rocky Mountain Nanotechnology LLC, established in 2003 and headquartered in Salt Lake City, Utah, specializes in the design and manufacture of ultra-precise solid platinum and platinum-iridium probes for scanning microscopy. RMN's probes are utilized worldwide by researchers and engineers engaged in nanoscale electrical and material characterization. For additional details, visit
www.rmnano.com.