#Taiwan #Hsinchu #MPI Corporation #250 GHz Probes #High-Frequency Testing

MPI Corporation Enhances High-Frequency Testing Capabilities with New 250-GHz Solution

MPI Corporation, a renowned global leader in advanced semiconductor testing solutions, has recently unveiled a cutting-edge, fully integrated 250-GHz broadband test solution. This innovative system is designed for the new Keysight NA5305A/7A PNA-X Frequency Extender and builds on MPI's extensive experience in sub-terahertz probing and on-wafer measurements.

Groundbreaking Technology for Semiconductor Testing

The new 250-GHz solution is a significant technological leap that integrates MPI's TITAN™ RF probes and probe station platform, offering leading performance in broadband S-parameter characterization up to 250 GHz. This advancement is the culmination of years of MPI's expertise in high-frequency measurements and reflects a deeper collaboration with Keysight Technologies, which combines state-of-the-art measurement devices with MPI's advanced on-wafer probing solutions to meet the increasing demand for sub-terahertz testing.

"MPI was the first company to demonstrate live single-sweep calibration and wafer-level measurements up to 250 GHz, both single-ended and differential," stated Stojan Kanev, Managing Director of MPI Corporation's Advanced Semiconductor Test (AST) Division. "This achievement further strengthens our tier-one capabilities in broadband on-wafer characterization with proven solutions extending beyond 200 GHz. Our innovative 250-GHz solution integrates TITAN™ probe technology with system expertise to provide stable, repeatable results, clear tip visibility, and protection features to ensure safe and straightforward setup. It saves engineers time, protects their systems, and delivers optimal performance."

Designed for Precision in Sub-THz Applications

The solution features specific probes including the TITAN™ T250MAK single-ended probes and the T250MSK differential probes, optimized for high-speed differential testing. These probes utilize a new 0.5-mm broadband coaxial interface and have exceptional features such as:

• - Extremely Low Insertion Loss: Provides high integrity measurements across the entire frequency range.
• - Outstanding Return Loss: Ensures minimal signal reflection for more accurate testing.
• - Unique Tip Visibility: Facilitates precise alignment and consistent contact during measurement sessions.
• - Retractable Tip Protection: Enhances both safety and ease of use during handling.
• - Available in Single-Ended and Dual Configurations: Tailored for various device types to maximize their testing capability.

These probes are entirely integrated within the MPI family of probe station platforms, allowing for temperature-controlled measurements on-wafer with minimal user intervention and maximum system repeatability.

Collaboration with Keysight Technologies

David Tanaka, Product Manager at Keysight, shared, “MPI's continuous innovation in high-frequency wafer probing plays a crucial role in extending the measurement capabilities of our broadband vector network analyzer platform. Their TITAN™ probes deliver the precision, repeatability, and system integration necessary to unlock the full potential of our 250-GHz solutions. This partnership also supports the growing need for advanced testing at sub-terahertz frequencies.”

Adapting to the Semiconductor Industry’s Evolving Needs

As sectors like AI, 5G/6G, and optical high-speed communication push semiconductors into new performance realms, the testing and measurement tools must evolve in tandem. The MPI 250-GHz broadband system meets these challenges by enabling:

• - Fully calibrated single-sweep broadband S-parameter measurements up to 250 GHz.
• - Support for both modulated broadband and nonlinear measurements.
• - Integration with leading test instruments for a complete measurement chain.

Currently, MPI's latest solution is already operational in evaluation environments at key customer and partner sites, accompanied by demonstration systems available in MPI facilities in Taiwan and the United States. A public debut of this outstanding technology is planned for the European Microwave Week (EuMW) 2025 in Utrecht, Netherlands, where a live setup will showcase this pioneering solution.

About MPI Corporation

Founded in 1995 and headquartered in Hsinchu, Taiwan, MPI Corporation specializes in advanced semiconductor test solutions for high-performance devices and wafer-level characterization. The company’s Advanced Semiconductor Test (AST) division focuses on RF/mmWave testing, high-performance device characterization, silicon photonics (SiPh), and wafer-level reliability. With innovations like the TITAN™ RF Probe Series, WaferWallet® Automation, and the TS/IFE platform family, MPI delivers precision, reliability, and performance across the semiconductor test ecosystem. For more information, visit www.mpi-corporation.com.