MPI Corporation Unveils Advanced 250 GHz Broadband Probe Solution for Semiconductor Testing

MPI Corporation Unveils 250 GHz Broadband Test Solution



MPI Corporation, a globally recognized leader in semiconductor test solutions, has introduced a state-of-the-art 250 GHz broadband testing solution to significantly advance electrical measurement capabilities for semiconductors. This latest innovation is designed to seamlessly integrate with the Keysight NA5305A/7A PNA-X Frequency Extender, building upon MPI's extensive expertise in sub-terahertz probing and on-wafer measurements.

The new 250 GHz probe solution harnesses MPI's TITAN™ RF Probes, combining them with their advanced wafer-level measurement platforms for superior performance in broadband S-parameter characterization, extending the frequency range up to 250 GHz. This milestone signifies a leap in high-frequency measurements, extending beyond what was previously achieved with MPI's earlier models that introduced capabilities beyond 200 GHz.

Innovative Features



MPI's Vision of Precision Measurement

MPI has a tradition of pioneering advancements in the field of high-frequency measurements. “We were the first to demonstrate live single sweep calibration and wafer level measurements up to 250 GHz, both single-ended and differential,” said Stojan Kanev, General Manager of MPI's Advanced Semiconductor Test (AST) Division. The new 250 GHz probe solution builds on MPI’s solid performance history in broadband on-wafer testing solutions.

Key features of the new probe solution include:
Types of Probes: The system includes the single-ended TITAN™ T250MAK and differential T250MSK probes specifically engineered for broadband device characterization.
Extraordinary Performance: The probes promise ultra-low insertion losses with excellent return loss across the full frequency range.
Enhanced Usability: The system highlights unique tip visibility and mechanical stability, allowing for easier alignment and consistent data collection.
Safety First: A retractable tip protector ensures safe handling during operations, safeguarding both the probes and the testing setup.
* Optimized Configurations: The probes come available in both single-ended (GSG) and dual (GSGSG) configurations, tailored for different device types.

This system is fully integrated with MPI's suite of probe station platforms, providing capabilities for temperature-controlled, wafer-level measurements requiring minimal user intervention while ensuring maximum repeatability in results.

Collaboration with Keysight Technologies



To further enhance their 250 GHz testing capabilities, MPI has collaborated closely with Keysight Technologies. “MPI's ongoing innovation in high-frequency wafer probing significantly enhances the measurement capabilities of our broadband vector network analyzer platforms,” stated David Tanaka, Product Manager at Keysight. “The precision and repeatability offered by their TITAN™ probes are critical in unlocking the full potential of our 250 GHz solution.”

Meeting Semiconductor Industry Demands



As trends like AI, 5G, and 6G push the limits of semiconductor performance, the demand for advanced testing technologies escalates. MPI's new 250 GHz system addresses these rising needs by enabling fully calibrated single-sweep broadband S-parameter measurements. It also supports modulated wideband and nonlinear measurements while integrating seamlessly with leading test equipment for a complete measurement ecosystem.

The innovative systems are already being tested in evaluation environments at notable customer and partner sites. Demonstration units can be seen at MPI facilities located in Taiwan and the United States, with an official public launch planned at the upcoming European Microwave Week (EuMW) 2025 in Utrecht, The Netherlands.

About MPI Corporation



Founded in 1995 and headquartered in Hsinchu, Taiwan, MPI Corporation stands at the forefront of advanced semiconductor test solutions, focusing on wafer-level characterization and device testing. The company specializes in RF/mmWave probing, high-power device characterization, Silicon Photonics, and wafer reliability testing. With innovations such as the TITAN™ RF Probe series and WaferWallet® automation, MPI is committed to delivering increased precision, reliability, and performance across the semiconductor test ecosystem.

To learn more about MPI Corporation's groundbreaking technologies, visit www.mpi-corporation.com.

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