Sony Semiconductor Solutions Launches Cutting-Edge X-ray CMOS Sensor for Superior Imaging Performance
On June 9, 2026, Sony Semiconductor Solutions Corporation announced the imminent release and mass production of its groundbreaking X-ray CMOS image sensor, the IMX711. This innovative sensor is engineered for applications in inspection and measurement, boasting industry-leading imaging speed and significantly reduced noise.
The IMX711 is designed to detect X-rays by directly converting them into electrical signals proportional to their energy. This feature allows for exceptionally fast image capture, achieving a maximum frame rate of 26,100 images per second. This rapid imaging speed is made possible by Sony's proprietary circuit technology, which effectively prevents charge saturation for precise measurements.
In addition to high-speed imaging, the IMX711 excels in minimizing noise, a crucial factor for detecting signals under low-flux conditions. By accurately detecting energy differences at the photon level, the sensor enhances measurement accuracy, thus broadening its application in various fields ranging from advanced device inspection to scientific measurements.
This X-ray sensor opens the door for advanced inspection technologies, providing users with enhanced capabilities to measure energy integration and obtain photon-level insights on a single chip. Such features make it suitable for high-speed inspection of moving objects, particularly in the battery and semiconductor applications.
The sensor's potential applications include:
The IMX711's development was a collaborative effort between Sony Semiconductor Solutions Corporation and RIKEN, leveraging advanced pixel structures designed by Dr. Takaki Hatsui. The technology also encompasses improvements in sensitivity, high X-ray resistance, and the ability to endure high voltage, critical for mass production.
For those interested in learning more about this state-of-the-art imaging technology, further details and product specifications are available on the official Sony Semiconductor website. As the IMX711 enters the market in the first quarter of fiscal year 2026, it signifies a monumental step forward in X-ray imaging technology, with promises of enhanced efficiency and versatility for various applications.
The IMX711 is designed to detect X-rays by directly converting them into electrical signals proportional to their energy. This feature allows for exceptionally fast image capture, achieving a maximum frame rate of 26,100 images per second. This rapid imaging speed is made possible by Sony's proprietary circuit technology, which effectively prevents charge saturation for precise measurements.
In addition to high-speed imaging, the IMX711 excels in minimizing noise, a crucial factor for detecting signals under low-flux conditions. By accurately detecting energy differences at the photon level, the sensor enhances measurement accuracy, thus broadening its application in various fields ranging from advanced device inspection to scientific measurements.
Key Features of the IMX711:
- - High-Speed Imaging: With a frame rate reaching up to 26,100 images per second, this sensor leads the industry, offering unprecedented speed in X-ray imaging.
- - Low Noise Performance: The sensor has a random noise level reduced to 34 e-rms, ensuring that even the faintest X-ray signals can be reliably detected, thus improving accuracy in low-light conditions.
- - Wide Dynamic Range: Capable of measuring X-ray energy over an extensive dynamic range, the IMX711 offers a unique capability to derive photon energy information from a single sensor, overcoming limitations observed in conventional sensors.
This X-ray sensor opens the door for advanced inspection technologies, providing users with enhanced capabilities to measure energy integration and obtain photon-level insights on a single chip. Such features make it suitable for high-speed inspection of moving objects, particularly in the battery and semiconductor applications.
The sensor's potential applications include:
- - High-Throughput Inspections: Ideal for sectors requiring fast inspection of dynamic objects.
- - Elemental Mapping: The sensor can differentiate photons based on energy levels, allowing for a two-dimensional distribution visualization of elemental composition.
- - Simultaneous Analysis: It aids in performing structural and elemental analyses concurrently, leveraging photon energy and spatial data.
The IMX711's development was a collaborative effort between Sony Semiconductor Solutions Corporation and RIKEN, leveraging advanced pixel structures designed by Dr. Takaki Hatsui. The technology also encompasses improvements in sensitivity, high X-ray resistance, and the ability to endure high voltage, critical for mass production.
For those interested in learning more about this state-of-the-art imaging technology, further details and product specifications are available on the official Sony Semiconductor website. As the IMX711 enters the market in the first quarter of fiscal year 2026, it signifies a monumental step forward in X-ray imaging technology, with promises of enhanced efficiency and versatility for various applications.
Topics Consumer Technology）
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