#South Korea #Park Systems #Atomic Force Microscopy #Gwacheon #Nanoscale IR

Park Systems Unveils Park FX40 IR

Park Systems Corp., a global leader in the field of atomic force microscopy (AFM) and nanoscale metrology, has recently launched the Park FX40 IR, a platform that innovatively combines full AFM performance with nanoscale infrared (IR) spectroscopy capabilities. Announced on May 29, 2026, the FX40 IR aims to revolutionize the way researchers gather chemical information and physical characteristics of materials in a single automated environment.

Key Features of the Park FX40 IR

The Park FX40 IR is a strategic extension of the company’s Nano-IR spectrometer lineup, enhancing their capabilities for small sample analysis. Notably, it allows scientists to acquire molecular composition data at a spatial resolution of less than 5 nanometers while capturing surface topography of samples measuring up to 20 mm x 20 mm, all without any contact with the sample surface. This feature is crucial as it mitigates the risk of damaging fragile specimens commonly evaluated in nanotechnology research.

The FX40 IR follows the successful models FX200 IR and FX300 IR, which introduced large-sample and full wafer-scale configurations for nanoscale IR spectroscopy in 2025. The newest device aims to offer similar high-level capabilities for small sample research while maintaining an intuitive user experience conducive to advancing scientific studies.

Innovative Automation and Design

Built on the foundation of the Park FX40 – touted as the first fully automated research-grade AFM – the FX40 IR integrates cutting-edge robotic technology and intelligent automation to manage all measurement operations. From probe exchanges to beam alignment, tip approach, and image acquisition, the FX40 promises reliable performance with minimal human intervention, ensuring high throughput and efficiency in research labs.

The machine is designed for stability with a low noise floor that enhances measurement accuracy while significantly reducing thermal drift through its advanced mechanical design. This sophisticated structure places the optical components separately from the Z stage, reducing the likelihood of mechanical disruptions that could compromise the integrity of measurements.

Advancing Nanoscale Chemical Characterization

At the heart of the Park FX40 IR's nanoscale chemical characterization capabilities is the Photo-induced Force Microscopy (PiFM) technology, which relies on detecting the forces induced by light between the AFM cantilever and the sample. This novel approach allows for the mapping of molecular vibrations without any physical contact, a stark contrast to traditional methods, ensuring that sample integrity is preserved.

By achieving spatial resolutions under 5 nm, the FX40 IR overcomes the traditional diffraction limits associated with optical methods such as Fourier Transform IR Spectroscopy (FT-IR). Furthermore, the spectroscopic analyses generated by the FX40 IR align closely with conventional FT-IR results, thereby providing familiar reference points for researchers experienced in bulk IR studies.

A Versatile Solution for Research Laboratories

In addition to its advanced functionalities, Park Systems offers a phased acquisition option for the Park FX40 IR, allowing laboratories to invest in a fully operational FX40 AFM and expand its capabilities with the IR module as needed. This flexibility empowers research teams to adapt to evolving analytical demands without the burden of completely replacing their existing equipment.

Dr. Sang-joon Cho, Executive Vice President at Park Systems, emphasizes that the FX40 IR isn't merely an add-on to existing technologies; it represents a comprehensive AFM platform with fully integrated nanoscale IR capabilities. With this unified system, researchers can benefit from consistent workflows and automation regardless of their sample sizes.

Conclusion

The introduction of the Park FX40 IR not only enhances the capabilities of Park Systems in the nanotechnology field but also empowers researchers across various disciplines to delve deeper into nanoscale studies with greater precision. For additional details regarding the Park FX40 IR, interested parties can visit www.parksystems.com.

With a commitment to continuous innovation and excellence, Park Systems continues to pave the way for future advancements in nanometrology, marking a significant leap toward more accessible and effective research solutions in the realm of material science.