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Park Systems Unveils Park FX40 IR

In a groundbreaking unveil, Park Systems Corp., a preeminent player in atomic force microscopy (AFM), has launched the Park FX40 IR, an integrated platform that marries full AFM performance with advanced nanoscale IR spectroscopy. This cutting-edge technology aims to elevate research capabilities across various scientific fields by allowing the simultaneous acquisition of chemical information and surface topography, all in a user-friendly automated environment.

Features and Capabilities

The FX40 IR stands out in today's competitive landscape as it delivers uncompromised nanoscale infrared (IR) chemical characterization and surface imaging in a single platform. Supporting samples measuring up to 20 mm × 20 mm, it can identify molecular compositions with remarkable spatial resolution at sub-5 nm. Such capabilities enable researchers to gather detailed insights without surface contact, addressing the limitations of conventional methods, which often rely on contact-mode techniques prone to damaging samples and introducing contamination.

Following the successful launches of the FX200 IR and FX300 IR in 2025, which catered to larger sample scopes, the FX40 IR extends Park's Nano-IR portfolio, enabling capabilities for small-scale research goals. This strategic move underscores Park Systems' commitment to providing integrated solutions that align with the evolving demands of nanotechnology and materials science research.

Innovative Design and Technology

The FX40 IR is constructed on the foundation of the Park FX40, known for being the world's first automated, research-grade AFM. This design incorporates intelligent automation, enabling seamless operations ranging from probe exchanges to precise beam alignment and image capturing. Its mechanical structure minimizes thermal drift, ensuring enhanced stability and reliability of results, critical factors in high-precision research environments.

Advanced Nanoscale IR Spectroscopy

A noteworthy highlight of the FX40 IR is its implementation of Photo-induced Force Microscopy (PiFM), a technique that detects microscopic vibrations without physical contact with the sample. This innovation allows for mapping of molecular vibrations while maintaining high spatial resolution, thus surpassing the usual optical diffraction limits set by traditional Fourier Transform IR Spectroscopy (FT-IR). Researchers can now retrieve nanoscale IR spectra that correlate closely with FT-IR benchmarks, offering a familiar reference for those experienced in conventional characterization methods.

Dr. Sang-joon Cho, Executive Vice President at Park Systems, emphasizes that the FX40 IR transcends being merely a spectrometer. It represents a comprehensive AFM platform wherein all aspects of nanoscale IR spectroscopy are intriguingly woven into its framework. This integration guarantees that users can experience uniform precision and efficiency, regardless of whether their analysis involves chip-sized samples or full wafers.

Flexible Acquisition Pathway

In recognition of varying research environments and budget constraints, Park Systems has introduced a phased pathway for acquiring the FX40 IR. Labs can begin with a fully operational FX40 AFM setup designed for future IR capabilities, including necessary infrastructure such as sound insulation enclosures. As the need for chemical analysis grows, they can upgrade to include the IR module, ensuring that research groups can transition seamlessly into this next level of sophistication without the need for entire system overhauls.

For further information on the Park FX40 IR and how it can assist in advancing your research initiatives, visit www.parksystems.com.

Conclusion

Park Systems continues to expand its footprint in testing and measurement solutions through continuous innovation and strategic evolution. The launch of the FX40 IR stands as a testament to their dedication, bridging the gap between AFM and nanoscale spectroscopy to empower researchers with unprecedented capabilities. As nanotechnology moves forward, platforms like the FX40 IR will undoubtedly play an essential role in uncovering the microscopic truths of matter.