#Germany #ZEISS #ZEN Core #Scanning Electron Microscopes #Oberkochen

ZEISS Introduces ZEN Core for SEMs

In an exciting development for the microscopy community, ZEISS has unveiled its latest software suite, ZEN core, designed specifically to enhance the operation of all ZEISS scanning electron microscopes (SEMs), including focused ion beam SEMs (FIB-SEMs). This innovative platform brings a wealth of advanced features and flexibility to both novice and experienced microscopists across various scientific fields, such as materials research, electronics, life sciences, and more.

A Unified Software Solution

The introduction of ZEN core reflects ZEISS’s commitment to improving microscopy workflows. The software serves as a universal control center that integrates seamlessly with ZEISS light and electron microscopes. It simplifies complex processes such as image acquisition, analytics, and data management, allowing users to navigate through their tasks effortlessly.

Designed for ease of use, ZEN core introduces an intuitive graphical user interface (GUI) that guides users through every stage of their workflows. Whether performing routine image captures or engaging in rigorous data analysis, users now have access to an efficient, streamlined experience that maximizes productivity.

Key Features of ZEN Core

One of the standout features of ZEN core is its Navigation Workspace, which organizes all essential microscopy control parameters, making it simple for operators to stay focused on their work without getting lost in the technology. This workspace not only provides a clear overview of samples but also allows the creation of an image gallery to organize collected data systematically.

Additionally, ZEN core offers customizable workbenches tailored to specific tasks, minimizing the number of controls displayed and ensuring that operators can follow a defined sequence of steps. This functionality is particularly beneficial in multi-user settings, improving data reliability and enabling inexperienced users to achieve consistency in their results.

Advanced Integration and Connectivity

ZEN core also marks a significant advancement in connected microscopy, enabling laboratories to integrate data from various microscopes efficiently. With robust database connectivity, users can maintain organized datasets across different instruments and locations, enhancing the overall research capability and allowing for deeper insights from correlative experiments.

The software's integration with AI-based workflows enhances its usability by providing intelligent solutions that streamline complex operations, including automated preparations for transmission electron microscopy (TEM) lamellae for FIB-SEM users. This blend of cutting-edge technology ensures that all users can rely on ZEN core to meet their specific microscopy needs.

Transforming Microscopy Workflows

ZEISS has positioned ZEN core as a transformative tool for the field of microscopy. "This software integrates the entire ZEISS imaging portfolio into a single cohesive solution and marks a significant step forward for efficiency and flexibility in connected microscopy environments," stated Tim Schubert, an imaging specialist at the Materials Research Institute at Aalen University.

The software is now compatible with the ZEISS EVO, Sigma, GeminiSEM, and Crossbeam families, catering to a broad range of applications and user levels. This means that whether one is conducting fundamental research or industry-specific quality assurance tasks, ZEN core aims to provide the tools necessary to enhance both experience and outcomes.

About ZEISS

Founded in 1846, ZEISS is a global leader in optics and optoelectronics, generating significant revenues across various segments. With a strong portfolio focused on growth areas like digitalization and healthcare, ZEISS is dedicated to advancing technology and capturing future opportunities. Furthermore, with a continued commitment to research and development, investing 15% of its revenue annually, ZEISS is well-positioned to maintain its leadership in microscopy and other technological innovations.