Park Systems Unveils FX40 IR: Next-Gen AFM and Nanometric IR Spectroscopy Solution

Park Systems Introduces FX40 IR: A Leap in Nanometric Analysis

On June 1, 2026, Park Systems Corp, a leading provider of atomic force microscopy (AFM) and nanometric metrology solutions, announced the commercial launch of its latest innovation, the Park FX40 IR. This state-of-the-art system combines advanced AFM capabilities with Infrared (IR) spectroscopy, offering researchers an automated platform designed for small sample sizes, thus enhancing their ability to analyze materials at an atomic level.

A Comprehensive Solution for Researchers

The FX40 IR expands Park Systems' existing range of Nano-IR spectrometers. With a capacity to analyze samples up to 20mm x 20mm, the FX40 IR enables simultaneous acquisition of chemical and topographical information. This breakthrough technology provides researchers with the ability to identify molecular composition with an unprecedented resolution of less than 5nm, all without making contact with the sample surface.

This innovative system is part of an ongoing development track for Park Systems, following the successful launches of the FX200 IR and FX300 IR in 2025. These previous models introduced nanometric IR spectroscopy to larger-scale configurations. Now, the FX40 IR allows for smaller sample research while maintaining the same high standards in performance.

Built on Robust Technology

The FX40 IR is rooted in the Park FX40 system, recognized as the world’s first fully automated research-level AFM. This system integrates robotics and intelligent automation to manage each measurement step—from probe changes to beam alignment and tip approach, culminating in image acquisition. The FX40 boasts low noise levels, minimal thermal drift, and enhanced mechanical stability due to its optimized mechanical design. The optical microscope is decoupled from the Z-stage to minimize sensitivity to mechanical disturbances, ensuring accurate measurements.

Nanometric Chemical Characterization

Nanometric IR chemical characterization on the FX40 IR leverages photo-induced force microscopy (PiFM). This technique detects forces between the AFM cantilever and the sample to map molecular vibrations non-invasively. By avoiding contact with the sample surface, researchers can achieve spatial resolutions below 5nm, surpassing traditional IR spectroscopy's diffraction limit of about 10µm and the 10-20nm resolution typically achieved by contact-based photothermal techniques.

Notably, the IR spectra obtained through the FX40 IR closely align with traditional FT-IR data regarding peak positions and relative band profiles, providing a reliable reference point for researchers experienced with bulk IR characterization.

Seamless Integration for Enhanced Workflow

As highlighted by Sang-joon Cho, Executive Vice President at Park Systems, the FX40 IR is not merely an additional spectrometer; it is a complete AFM platform with fully integrated nanometric IR capabilities. This development ensures that users can maintain the same level of precision, workflow, and automation, regardless of whether they are working on small chip samples or full wafer analyses. The FX40 IR allows for streamlined operations without compromising on data quality or reliability.

Park Systems is also rolling out a phased acquisition option for the FX40 IR, allowing laboratories to purchase the fully functional, preconfigured FX40. This setup provides a scalable integration path for IR capabilities, enabling teams to invest in a world-class automated AFM while progressively expanding their analytical capabilities as necessary.

This strategic approach grants research groups initial access to cutting-edge technology, with the flexibility to incorporate IR spectroscopy features later without needing to replace their existing systems.

Conclusion

Park Systems remains at the forefront of nanometrology, delivering advanced measurement solutions vital for research and industry applications. As demand grows for precise material characterization in fields such as semiconductor manufacturing and nanotechnology research, innovations like the FX40 IR will play an essential role in shaping the future of scientific inquiry and technological advancement.

For further information about the Park FX40 IR, visit Park Systems Website.

With regional offices across America, Europe, and Asia, Park Systems continues to support its customers in various sectors, including semiconductor fabrication, materials science, and nanotechnology research. Its commitment to excellence and innovation drives its leaders to remain at the industry's cutting edge.