On-Demand Webinar on Next-Generation Material Analysis Now Available

Overview of the Webinar

On October 16, 2025, a collaborative webinar featuring Carl Zeiss, Oxford Instruments, and JFE Tech Research took place, focusing on advanced techniques in material analysis. This event attracted over 300 participants, comprising technical experts and researchers keen on enhancing performance through state-of-the-art technologies. With a theme emphasizing the integration of scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDX), the session delivered substantial insights into the innovative solutions and applications available in modern material research.

The webinar, titled "Capturing Previously Unseen Surface Structures with ULV-SEM Technology and High-Sensitivity EDX! Exploring the Integration of Analysis Points, Microscopy Techniques, and Innovative Tools for Next-Gen Material Analysis," offered participants extensive knowledge tailored to their specialized needs.

This collective effort by the three companies seeks to promote collaboration and synergy in developing solutions that meet the rising demands of the material analysis field.

Highlights of the Event

Despite being a three-hour-long session, the webinar maintained exceptionally high engagement, with over 80% of attendees remaining until the end. Post-event feedback highlighted attendees' appreciation of the learning experience, emphasizing the informative content and excellent execution of the seminar.

Key discussions included:
1. Carl Zeiss's Gemini SEM: This advanced electron microscope was praised for its "sweet spot imaging" technology, which achieves both image acquisition and high-sensitivity elemental analysis. Case studies demonstrated high-resolution observations under ultra-low acceleration voltage and surface elemental analysis, showcasing its unique capabilities.
2. Oxford Instruments' Cutting-Edge EDX Detectors: Attendees explored the new Ultim Extreme Infinity detector and the Unity system, which enhances rapid and high-precision compositional analysis across broad areas. These innovations adapt well to the evolving needs of both research and industrial applications.
3. JFE Tech Research's Application Examples: The company presented various advanced analytical applications showcasing the diverse potential and adaptability of collaborative techniques in resolving material challenges.

On-Demand Access

Due to the positive outcome and strong demand from those who missed the live event, the recorded webinar will be available on-demand starting November 17, 2025, at 9 AM. This allows wider access to the valuable insights shared by industry experts during the session. Interested viewers can access the on-demand webinar through the following link: On-Demand Webinar.

Future Collaboration

Looking ahead, Carl Zeiss, Oxford Instruments, and JFE Tech Research are committed to deepening their partnership. Together, they aim to develop various technologies that enhance material analysis capabilities and deliver innovative solutions to the market. The goal is to ensure they cater effectively to the evolving landscape of material science research.

About the Companies

- Carl Zeiss: Founded in 1846 in Germany, Zeiss is a global leader in optical technology, providing innovative solutions across numerous sectors, including industrial metrology, life sciences, and materials research. The company invests 15% of its sales in R&D, underlining its commitment to advancing technology.
- Oxford Instruments: Established in 1959, Oxford Instruments has become a provider of high-tech solutions for industry and research. Their portfolio includes advanced products geared toward semiconductor manufacturing and quantum technology.
- JFE Tech Research: Known for offering comprehensive analytical services, JFE Tech Research specializes in the provision of one-stop solutions combining analysis, evaluation, and consulting to address technical challenges in a wide range of industrial sectors.